MET Service Center Facilities:

Materials Characterization

Transmission Electron Microscope (TEM)

200-kV FEI Tecnai F20 FEG-TEM/STEM

Gatan GIF2002 spectrometer

EDS detector

Fishione HAADF detector

Sample holders (ST, DT, heating, cooling)

  • HRTEM (0.24 nm resolution)

  • Z-contrast

  • SAED, nanodiffracation

  • EELS (0.8 eV resolution)

  • EDS

Capabilities:

  • morphology and size analysis

  • phase and crystal structure analysis

  • structural defect analysis

  • elemental and chemical analysis

  • elemental mapping

  • in-situ heating studies (structure evolution and phase transformation, etc.)

Scanning Electron Microscope (SEM)

FEI Nova600 FEG-SEM

EDS detector

  • SE imaging (1 nm resolution)

  • BE imaging

  • EDS

Capabilities:

  • morphology and size analysis

  • elemental analysis

Scanning Electron Microscope (SEM)

TESCAN Vega3 SEM

EDS detector

SE imaging (5 nm resolution)

EDS

EBIC

Capabilities:

  • morphology and size analysis

  • elemental analysis

  • EBIC analysis (diffusion length, non-radiative defect distribution, etc.)

X-ray Diffraction (XRD)

BRUKER Discovery D8 HR-XRD

dynamic scintillation detector

LynxEye(TM) detector

Dome Heating Stage DHS 1100

Bruker EVA software

ICCD PDF-2

powder diffraction, high-resolution XRD

in-situ heating

Capabilities:

  • Powder diffraction for phase identification and analysis

  • Grain size analysis

  • Thin film analysis

  • In-situ measurements (phase transformation, in situ solid state reactions, particle agglomeration, etc.)

UHV Surface Analysis

X-ray Photoelectron Spectroscopy (XPS/UHV) also known as Electron Spectroscopy for Chemical Analysis (ESCA) is a quantitative spectroscopic technique to analyze chemical composition of the surface of solids.

  • VG Scientific MultiLab 3000

  • 10-9 Torr base pressure

  • CLAM 4 hemispherical energy analyzer

  • Al/Mg x-ray twin source (1253.6 eV (MgKa), 1486.6 eV (AlKa))

  • differentially-pumped He cold cathode capillary discharge UV lamp (21.2 eV (He I radiation) or 40.8 eV (He II radiation)

  • X-ray Photoelectron spectroscopy

  • UV Photoelectron spectroscopy

 

Capabilities:

  • Elemental  identification (0.1 at% (1ppt), all elements except H, He)

  • Quantification of chemical composition (~10% - 20% accuracy)

  • Chemical state of elements (with 0.5 eV accuracy) 

  • Oxidation

  • Catalysis

  • Electron band structure

  • Valence band maximum

  • Work function

  • Density of states

  • Depth profiling by angle resolve analysis (up to10nm)

Photoluminescence (PL)/Raman

Renishaw inVia confocal Raman/PL microscope system equipped with three excitation laser lines of 325 nm, 442 nm, and 632.8 nm and detectors and optics allowing measurements in the spectral range from 0.7 eV to 3.7 eV.

Typical spectral range: 200 - 4000 cm-1

Spatial resolution (confocal): < 1 μm (lateral), < 2 μm (depth)

Spectral resolution: ~ 1 cm-1

  • Raman point and mapping analyses to study small and large samples 

  • Photoluminescence  analysis

  • Optionally:  thermal analysis using variable temperature cold stage (-196°C up to RT), stability 0.10°C

 

Capabilities:

  • Raman spectroscopy for vibrational mode analysis and structure identification of organic and inorganic molecules, polymers, liquids, gels, amorphous and crystalline materials, also biological and forensic samples.

  • PL for bandgap measurements and defect luminescence

Thermogravimetric Analyzer (TGA) TA 2050

Thermal analysis

Capabilities:

  • composition analysis

  • thermal stability analysis

  •  and related phenomena

  • Phase transitions

  • Simultaneous measurements of heat flow and weight changes as a function of temperature (or time) under a controlled atmosphere

Differential Scanning Calorimeter (DSC) Q20 (-40oC to 600oC)

Thermal analysis

 

Capabilities:

  • composition analysis

  • thermal stability analysis

  •  and related phenomena

  • Phase transitions

  • Simultaneous measurements of heat flow and weight changes as a function of temperature (or time) under a controlled atmosphere

Simultaneous Thermal Analyzers Q600 SDT (RT to 1500oC)

Thermal analysis

 

Capabilities:

  • composition analysis

  • thermal stability analysis

  •  and related phenomena

  • Phase transitions

  • Simultaneous measurements of heat flow and weight changes as a function of temperature (or time) under a controlled atmosphere

Micromeritics TriStar 3000

Automated gas adsorption analyzer using BET

  • Study of surface area

  • Study of porosity

Capabilities:

  • Full adsorption and desorption isotherms

  • Single-Point and multipoint BET surface area

  • Langmuir surface area

  • BJH absorption and desorption

  • Mesopore and Macropore: Volume and Area distributions by pore size

  • Total pore volume

  • MP-Method

  • T-Plot

Brookhaven Instrument Corporation 90Plus

Particle Size Analyzer

  • Laser light scattering technique for characterization of colloids and particles dispersed in liquids

Capabilities:

  • Particle-size distribution measurement

  • Zeta potential measurement for surface charge analysis

PerkinElmer Spectrum BX FTIR System

FTIR system using excitation laser source of 633 nm.

Spectral range: 400 – 4000 cm-1 (25 - 2.5 µm)

Spectral resolution: better than 0.8 cm-1 (isolates sharp absorbance bands)

  • FTIR analysis in transmission and reflective mode (no need for cutting samples)

Capabilities:

  • Analysis of IR-active modes in organic and inorganic materials

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Fax: 502-852-8619

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LOCATION

University of Louisville

216 Eastern Parkway

Louisville, KY 40292

© 2017 University of Louisville by Feral Fagiola