MET Service Center Facilities:
Power Electronics
Keithley 8010 High Power Device Test Fixture
Provides connections for testing packaged high power devices at up to 3000V or 100A.
Capabilities:
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This allows devices with two terminals (diodes) or three terminals (transistors) to be characterized safely and accurately.
Keithley 4200-SCS Parameter Analyzer
Modular, fully integrated parameter analyzer that performs electrical characterization of materials, semiconductor devices and processes
Capabilities:
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Performs current versus voltage (I-V) measurements.
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Performs capacitance versus voltage (C-V), capacitance versus time (C-t), and capacitance versus frequency (C-f) measurements from 1kHz–10MHz.
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Performs very low frequency C-V measurements from 10mHz–10Hz.
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Performs quasi-static C-V measurements.
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Performs ultra-fast I-V measurements that are synchronized
Micromanipulator Probe Station
Four-point Probe station
Capabilities:
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For measuring sheet resistance, I-V curves, C-V curves and device performance.
